TANGO
Test Log
|
Company |
: THALES AIR DEFENCE |
|
|
Project |
: TANGO Aquila Test Bench |
|
|
Program |
: TRAC_DIGITAL_GENERATION_TEST |
|
|
Serial Number |
: 13001 |
|
|
Start Time |
: 12/27/13 11:00:02
|
Task 1 : CKTST 1 :
VISUAL INSPECTION
|
# |
Name |
Pin |
- |
Value |
- |
Result |
Status |
|
001 |
test 1_1 : external check |
- |
"Correct" |
- |
"Correct" |
Pass |
Task 2 : CKTST 2 :
POWER SUPPLY TEST
|
# |
Name |
Pin |
Unit |
Min |
Max |
Result |
Status |
|
001 |
test 2_1 : +5 V voltage short
circuit |
P1-36/P1-37 |
Ohm |
300.000 |
361.048 |
Pass |
|
002 |
test 2_2 : +15 V voltage short
circuit |
P1-40/P1-41 |
Ohm |
300.000 |
350.238 |
Pass |
|
003 |
test 2_3 : -5,2 V voltage short
circuit |
P1-46/P1-47 |
Ohm |
30000.000 |
33278.880 |
Pass |
|
# |
Name |
Pin |
Unit |
Tolerence |
Value |
Result |
Status |
|
004 |
test 2_4 : +5 V current level |
P1-36/P1-37 |
Amp |
+/ -0.300 |
0.900 |
1.069 |
Pass |
|
005 |
test 2_5 : +15 V current level |
P1-40/P1-41 |
Amp |
+/ -0.100 |
0.531 |
0.582 |
Pass |
|
006 |
test 2_6 : -5,2 V current level |
P1-46/P1-47 |
Amp |
+/ -0.050 |
0.153 |
0.161 |
Pass |
|
007 |
test 2_7 : +5 V power supply
voltage |
P1-36/P1-37 |
Volt |
+/ -0.250 |
5.000 |
5.242 |
Pass |
|
008 |
test 2_8 : +15 V power supply
voltage |
P1-40/P1-41 |
Volt |
+/ -0.750 |
15.000 |
15.205 |
Pass |
|
009 |
test 2_9 : -5,2 V power supply
voltage |
P1-46/P1-47 |
Volt |
+/ -0.250 |
-5.200 |
-5.188 |
Pass |
Task 3 : CKTST 3 : J3,
J4, J7 AND J9 OUTPUT TEST
|
# |
Name |
Pin |
Unit |
Tolerence |
Value |
Result |
Status |
|
001 |
test 3_1A : J3 (H30_REF_1) output
power test |
J3 |
dBm |
+/ -1.000 |
2.000 |
2.363 |
Pass |
|
002 |
test 3_1B : J3 (H30_REF_1) frequency
test |
J3 |
MHZ |
+/ -0.100 |
31.080 |
31.079 |
Pass |
|
003 |
test 3_2A : J4 (H30_REF_2) output
power test |
J4 |
dBm |
+/ -1.000 |
10.000 |
10.272 |
Pass |
|
004 |
test 3_2B : J4 (H30_REF_2)
frequency test |
J4 |
MHZ |
+/ -0.100 |
31.080 |
31.079 |
Pass |
|
# |
Name |
Pin |
Unit |
Min |
Max |
Result |
Status |
|
005 |
test 3_3A1 : J7 (HCD_RES) output
clock TTL high level test |
J7 |
Volt |
1.600 |
1.958 |
Pass |
|
006 |
test 3_3A2 : J7 (HCD_RES) output
clock TTL low level test |
J7 |
Volt |
0.800 |
0.047 |
Pass |
|
# |
Name |
Pin |
Unit |
Tolerence |
Value |
Result |
Status |
|
007 |
test 3_3B : J7 (HCD_RES) frequency
test |
J7 |
MHZ |
+/ -0.100 |
1.295 |
1.295 |
Pass |
|
# |
Name |
Pin |
Unit |
Min |
Max |
Result |
Status |
|
008 |
test 3_4A1 : J9 (H20_RES_OUT)
output clock TTL high level test |
J9 |
Volt |
1.600 |
3.721 |
Pass |
|
009 |
test 3_4A2 : J9 (H20_RES_OUT) output
clock TTL low level test |
J9 |
Volt |
0.800 |
0.113 |
Pass |
|
# |
Name |
Pin |
Unit |
Tolerence |
Value |
Result |
Status |
|
010 |
test 3_4B : J9 (H20_RES_OUT)
frequency test |
J9 |
MHZ |
+/ -0.100 |
20.720 |
20.714 |
Pass |
|
011 |
test 3_5 : J7 (HCD_RES_OUT) output
clock delay test |
J7 |
uSec |
+/ -0.150 |
1.500 |
1.511 |
Pass |
|
012 |
test 3_6 : J9 (H20_RES_OUT) output
clock delay test |
J9 |
nSec |
+/ -70.000 |
720.000 |
754.546 |
Pass |
Task 4 : CKTST 4 :
Sy0 OUTPUT TEST
|
# |
Name |
Pin |
Unit |
Min |
Max |
Result |
Status |
|
001 |
test 4_1A : Sy0 duration(with
bus-ci = 00 H) |
P1-1 |
uSec |
+/ -0.100 |
1.570 |
3.474 |
Pass |
|
002 |
test 4_1B: Sy0 delay from SYGENE(with
bus-ci = 00 H) |
P1-1 |
nSec |
+/ -20.000 |
160.000 |
158.078 |
Pass |
|
003 |
test 4_2A : Sy0 duration(with
bus-ci = 01 H) |
P1-1 |
uSec |
+/ -0.100 |
1.760 |
1.780 |
Pass |
|
|
004 |
test 4_2B: Sy0 delay from SYGENE(with
bus-ci = 01 H) |
P1-1 |
nSec |
+/ -20.000 |
160.000 |
159.055 |
Pass |
|
005 |
test 4_3A : Sy0 duration(with
bus-ci = 02 H) |
P1-1 |
uSec |
+/ -0.100 |
8.010 |
8.046 |
Pass |
|
006 |
test 4_3B: Sy0 delay from SYGENE(with
bus-ci = 02 H) |
P1-1 |
nSec |
+/ -20.000 |
160.000 |
157.868 |
Pass |
|
007 |
test 4_4A : Sy0 duration(with
bus-ci = 03 H) |
P1-1 |
uSec |
+/ -0.000 |
0.000 |
0.000 |
Pass |
|
008 |
test 4_5A : Sy0 duration(with
bus-ci = 04 H) |
P1-1 |
uSec |
+/ -0.100 |
98.020 |
98.454 |
Pass |
|
009 |
test 4_5B: Sy0 delay from
SYGENE(with bus-ci = 04 H) |
P1-1 |
nSec |
+/ -20.000 |
160.000 |
158.386 |
Pass |
|
010 |
test 4_6A : Sy0 duration(with
bus-ci = 05 H) |
P1-1 |
uSec |
+/ -0.100 |
200.000 |
200.434 |
Pass |
|
011 |
test 4_6B: Sy0 delay from
SYGENE(with bus-ci = 05 H) |
P1-1 |
+/ -20.000 |
160.000 |
158.108 |
Pass |
|
012 |
test 4_7A: Sy0 duration(with
bus-ci = 06 H) |
P1-1 |
uSec |
+/ -0.100 |
300.000 |
300.482 |
Pass |
|
013 |
test 4_7B: Sy0 delay from
SYGENE(with bus-ci = 06 H) |
P1-1 |
+/ -20.000 |
160.000 |
158.134 |
Pass |
|
014 |
test 4_8A : Sy0 duration(with
bus-ci = 07 H) |
P1-1 |
uSec |
+/ -0.100 |
75.410 |
75.869 |
Pass |
|
015 |
test 4_8B : Sy0 delay from
SYGENE(with bus-ci = 07 H) |
P1-1 |
nSec |
+/ -20.000 |
160.000 |
158.482 |
Pass |
Task 5 : CKTST 5 :
EXTERNAL PHASE TEST
|
# |
Name |
Pin |
- |
Value |
- |
Result |
Status |
|
001 |
test 5_1 : J35 output external
phase test (ci=07,without accumulation) |
J35 |
- |
"Correct" |
- |
"Correct" |
Pass |
|
002 |
test 5_2 : J35 output external
phase test (ci=07,with accumulation) |
J35 |
- |
"Correct" |
- |
"Correct" |
Pass |
|
003 |
test 5_3 : J35 output external
phase test (ci=06,without accumulation) |
J35 |
- |
"Correct" |
- |
"Correct" |
Pass |
|
004 |
test 5_4 : J35 output external
phase test (ci=06,with accumulation) |
J35 |
- |
"Correct" |
- |
"Correct" |
Pass |
Task 6 : CKTST 6:
IMPULSE TIMAL TEST
|
# |
Name |
Pin |
Unit |
Tolerence |
Value |
Result |
Status |
|
001 |
test 6_1A : J1 output signal
DURATION test (with bus-ci = 00 H) |
J1 |
uSec |
+/ -0.100 |
5.000 |
5.018 |
Pass |
|
002 |
test 6_1B : J1 output signal DELAY
test (with bus-ci = 00 H) |
J1 |
uSec |
+/ -0.020 |
4.996 |
4.979 |
Pass |
|
003 |
test 6_2A : J1 output signal
DURATION test (with bus-ci = 01 H) |
J1 |
uSec |
+/ -0.100 |
3.500 |
3.464 |
Pass |
|
004 |
test 6_2B : J1 output signal DELAY
test (with bus-ci = 01 H) |
J1 |
uSec |
+/ -0.020 |
4.996 |
4.979 |
Pass |
|
005 |
test 6_3A : J1 output signal
DURATION test (with bus-ci = 02 H) |
J1 |
uSec |
+/ -0.100 |
10.000 |
9.972 |
Pass |
|
006 |
test 6_3B : J1 output signal DELAY
test (with bus-ci = 02 H) |
J1 |
uSec |
+/ -0.020 |
4.996 |
4.979 |
Pass |
|
007 |
test 6_4A : J1 output signal
DURATION test (with bus-ci = 03 H) |
J1 |
uSec |
+/ -0.100 |
3.090 |
3.077 |
Pass |
|
008 |
test 6_4B : J1 output signal DELAY
test (with bus-ci = 03 H) |
J1 |
uSec |
+/ -0.020 |
1.346 |
1.350 |
Pass |
|
009 |
test 6_5A: J1 output signal
DURATION test (with bus-ci = 04 H) |
J1 |
uSec |
+/ -0.100 |
100.000 |
100.013 |
Pass |
|
010 |
test 6_5B: J1 output signal DELAY
test (with bus-ci = 04 H) |
J1 |
uSec |
+/ -0.020 |
4.996 |
4.997 |
Pass |
|
011 |
test 6_6A : J1 output signal
DURATION test (with bus-ci = 05 H) |
J1 |
uSec |
+/ -0.100 |
202.000 |
202.010 |
Pass |
|
012 |
test 6_6B : J1 output signal DELAY
test (with bus-ci = 05 H) |
J1 |
uSec |
+/ -0.020 |
4.996 |
4.998 |
Pass |
|
013 |
test 6_7A : J1 output signal
DURATION test (with bus-ci = 06 H) |
J1 |
uSec |
+/ -0.100 |
302.000 |
302.009 |
Pass |
|
014 |
test 6_7B : J1 output signal DELAY
test (with bus-ci = 06 H) |
J1 |
uSec |
+/ -0.020 |
4.996 |
4.999 |
Pass |
|
015 |
test 6_8A : J1 output signal
DURATION test (with bus-ci = 07 H) |
J1 |
uSec |
+/ -0.100 |
75.600 |
75.621 |
Pass |
|
016 |
test 6_8B : J1 output signal DELAY
test (with bus-ci = 07 H) |
J1 |
uSec |
+/ -0.050 |
5.650 |
5.637 |
Pass |
Task 7 : CKTST 7:
J1 OUTPUT POWER TEST
|
# |
Name |
Pin |
Unit |
Tolerence |
Value |
Result |
Status |
|
001 |
test 7_1 : J1 output power level
(with bus-ci = 00 H) |
J1 |
dBm |
+/ -0.500 |
10.000 |
10.176 |
Pass |
|
002 |
test 7_2 : J1 output power level
(with bus-ci = 01 H) |
J1 |
dBm |
+/ -0.500 |
10.000 |
10.055 |
Pass |
|
003 |
test 7_3 : J1 output power level
(with bus-ci = 02 H) |
J1 |
dBm |
+/ -0.500 |
10.000 |
9.899 |
Pass |
|
004 |
test 7_4 : J1 output power level
(with bus-ci = 03 H) |
J1 |
dBm |
+/ -0.500 |
10.000 |
9.902 |
Pass |
|
005 |
test 7_5 : J1 output power level
(with bus-ci = 04 H) |
J1 |
dBm |
+/ -0.500 |
10.000 |
10.020 |
Pass |
|
006 |
test 7_6 : J1 output power level
(with bus-ci = 05 H) |
J1 |
dBm |
+/ -0.500 |
10.000 |
9.981 |
Pass |
|
007 |
test 7_7 : J1 output power level
(with bus-ci = 06 H) |
J1 |
dBm |
+/ -0.500 |
10.000 |
9.969 |
Pass |
|
008 |
test 7_8 : J1 output power level
(with bus-ci = 07 H) |
J1 |
dBm |
+/ -0.500 |
10.000 |
9.863 |
Pass |
Task 8 : CKTST 8 : J1
OUTPUT SIGNAL FREQUENTIAL TEST
|
# |
Name |
Pin |
- |
Value |
- |
Result |
Status |
|
001 |
test 8_1 : J1 output signal (with
bus-ci = 00 H) |
J1 |
- |
"Correct" |
- |
"Correct" |
Pass |
|
002 |
test 8_2 : J1 output signal (with bus-ci
= 01 H) |
J1 |
- |
"Correct" |
- |
"Correct" |
Pass |
|
003 |
test 8_3 : J1 output signal (with
bus-ci = 02 H) |
J1 |
- |
"Correct" |
- |
"Correct" |
Pass |
|
004 |
test 8_4 : J1 output signal (with
bus-ci = 03 H) |
J1 |
- |
"Correct" |
- |
"Correct" |
Pass |
|
005 |
test 8_5 : J1 output signal (with
bus-ci = 04 H) |
J1 |
- |
"Correct" |
- |
"Correct" |
Pass |
|
006 |
test 8_6 : J1 output signal (with
bus-ci = 05 H) |
J1 |
- |
"Correct" |
- |
"Correct" |
Pass |
|
007 |
test 8_7A : J1 output signal (with
bus-ci = 06 H) |
J1 |
- |
"Correct" |
- |
"Correct" |
Pass |
|
# |
Name |
Pin |
Unit |
Tolerence |
Value |
Result |
Status |
|
008 |
test 8_7B : J1 output signal 0.3dB
bandwidth(with bus-ci = 06 H) |
J1 |
MHZ |
+/ -0.150 |
1.500 |
1.447 |
Pass |
|
# |
Name |
Pin |
- |
Value |
- |
Result |
Status |
|
009 |
test 8_8A : J1 output signal (with
bus-ci = 07 H) |
J1 |
- |
"Correct" |
- |
"Correct" |
Pass |
|
# |
Name |
Pin |
Unit |
Min |
Max |
Result |
Status |
|
010 |
test 8_8B : J1 output signal
parasites strip test (with bus-ci = 07 H) |
J1 |
dBc |
70.000 |
71.449 |
Pass |
Task 9 : CKTST 9 :
BIT BLOCK TEST
|
# |
Name |
Pin |
Unit |
Min |
Max |
Result |
Status |
|
001 |
test 9_1 : Geldti static test TTL
high |
P1-5 |
Volt |
1.600 |
2.474 |
Pass |
|
002 |
test 9_1 : Geldti static test TTL
low |
P1-5 |
Volt |
0.800 |
0.145 |
Pass |
|
003 |
test 9_2A : Correct Agen static
test |
P1-8 |
Volt |
2.000 |
3.219 |
Pass |
|
004 |
test 9_2B : Correct Pgen static
test |
P1-7 |
Volt |
0.800 |
0.427 |
Pass |
|
005 |
test 9_3A : False Agen static test
|
P1-8 |
Volt |
0.800 |
0.223 |
Pass |
|
006 |
test 9_3B : False Pgen static test
|
P1-7 |
Volt |
2.000 |
3.159 |
Pass |
Task 10 : CKTST 10
: FINAL OPERATION
|
# |
Test Name |
Pin |
Result |
Status |
|
001 |
Final operation |
- |
- |
- |
|
Stop Time |
: 12/27/2013 11:43:54 AM |
|
Elapsed Time |
: 44.50 minutes |
|
UUT Status |
: Pass |
|
Signature |
:
__________________________________ |